Issued Patents 2011
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8067951 | Method of expanding tester drive and measurement capability | — | 2011-11-29 |
| 7994803 | Calibration substrate | — | 2011-08-09 |
| 7977958 | Bi-directional buffer for interfacing test system channel | — | 2011-07-12 |
| 7960990 | Closed-grid bus architecture for wafer interconnect structure | John M. Long | 2011-06-14 |
| 7952375 | AC coupled parameteric test probe | Benjamin N. Eldridge, A. Nicholas Sporck | 2011-05-31 |
| 7928750 | Contactless interfacing of test signals with a device under test | — | 2011-04-19 |
| 7889022 | Electromagnetically coupled interconnect system architecture | — | 2011-02-15 |
| 7880486 | Method and apparatus for increasing operating frequency of a system for testing electronic devices | — | 2011-02-01 |
| 7863915 | Probe card cooling assembly with direct cooling of active electronic components | — | 2011-01-04 |