Issued Patents 2011
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8033838 | Microelectronic contact structure | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2011-10-11 |
| 7990164 | Method of designing a probe card apparatus with desired compliance characteristics | — | 2011-08-02 |
| 7977956 | Method and apparatus for probe card alignment in a test system | Keith J. Breinlinger, Eric D. Hobbs, Douglas S. Ondricek | 2011-07-12 |
| 7967621 | Electrical contactor, especially wafer level contactor, using fluid pressure | — | 2011-06-28 |
| 7956633 | Stacked guard structures | — | 2011-06-07 |
| 7952375 | AC coupled parameteric test probe | A. Nicholas Sporck, Charles A. Miller | 2011-05-31 |
| 7948252 | Multilayered probe card | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu, Poya Lotfizadeh, Chih-Chiang Tseng | 2011-05-24 |
| 7936177 | Providing an electrically conductive wall structure adjacent a contact structure of an electronic device | Keith J. Breinlinger, David Pritzkau | 2011-05-03 |
| 7930219 | Method and system for designing a probe card | Mark W. Brandemuehl, Stefan Graef, Yves Parent | 2011-04-19 |
| 7920989 | Remote test facility with wireless interface to local test facilities | Igor Y. Khandros | 2011-04-05 |
| 7898242 | Probe card assembly with an interchangeable probe insert | Carl V. Reynolds, Nobuhiro Kawamata, Takao Saeki | 2011-03-01 |
| 7897435 | Re-assembly process for MEMS structures | Gaetan L. Mathieu | 2011-03-01 |
| 7884006 | Method to build a wirebond probe card in a many at a time fashion | Bruce Barbara | 2011-02-08 |
| 7880489 | Printing of redistribution traces on electronic component | Yoshikazu Hatsukano, Igor Y. Khandros, Gaetan L. Mathieu | 2011-02-01 |
| 7868632 | Composite motion probing | Timothy E. Cooper, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu | 2011-01-11 |