Issued Patents 2011
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8001433 | Scan testing architectures for power-shutoff aware systems | Sandeep Bhatia, Patrick Gallagher, Brian Foutz | 2011-08-16 |
| 7979764 | Distributed test compression for integrated circuits | Brian Foutz, Patrick Gallagher, Carl Barnhart | 2011-07-12 |
| 7944285 | Method and apparatus to detect manufacturing faults in power switches | Senthil Arasu Thirunavukarasu, Bambuda Chen Chien Leung, Shaleen Bhabu | 2011-05-17 |
| 7926012 | Design-For-testability planner | Nitin Parimi, Patrick Gallagher, Brian Foutz | 2011-04-12 |
| 7886263 | Testing to prescribe state capture by, and state retrieval from scan registers | Senthil Arasu Thirunavukarasu, Shaleen Bhabu | 2011-02-08 |
| 7877715 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Senthil Arasu Thirunavukarasu, Shaleen Bhabu | 2011-01-25 |