Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8001433 | Scan testing architectures for power-shutoff aware systems | Sandeep Bhatia, Brian Foutz, Vivek Chickermane | 2011-08-16 |
| 7979764 | Distributed test compression for integrated circuits | Brian Foutz, Vivek Chickermane, Carl Barnhart | 2011-07-12 |
| 7926012 | Design-For-testability planner | Nitin Parimi, Brian Foutz, Vivek Chickermane | 2011-04-12 |