Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8031931 | Printed fourier filtering in optical inspection tools | Dan Fuchs | 2011-10-04 |
| 7973921 | Dynamic illumination in optical inspection systems | Tsafrir Avni | 2011-07-05 |
| 7961763 | System for detection of wafer defects | Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Ram Segal | 2011-06-14 |
| 7924420 | Optical inspection including partial scanning of wafers | Gilad Shomrony, Arnon Gratch | 2011-04-12 |