Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7961763 | System for detection of wafer defects | Dov Furman, Mark Wagner, Noam Dotan, Ram Segal, Shai Silberstein | 2011-06-14 |
GN
Gad Neumann
Overall (2011): #300,290 of 364,097Top 85%
1
Patents 2011