SL

Scott E. Lindsey

AS Aehr Test Systems: 2 patents #2 of 12Top 20%
🗺 California: #4,350 of 41,698 inventorsTop 15%
Overall (2011): #36,617 of 364,097Top 15%
3
Patents 2011

Issued Patents 2011

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
8030957 System for testing an integrated circuit of a device and its method of use Junyje Yeh, Jovan Jovanovic, Seang P. Malathong 2011-10-04
7902846 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon 2011-03-08
D630166 Connector Jovan Jovanovic, David S. Hendrickson 2011-01-04