Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7969175 | Separate test electronics and blower modules in an apparatus for testing an integrated circuit | David S. Hendrickson, Jovan Jovanovic, William D. Barraclough | 2011-06-28 |
| 7928754 | Wafer level burn-in and electrical test system and method | John Hoang, Jerzy Lobacz | 2011-04-19 |
| 7902846 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon | 2011-03-08 |