Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8058891 | Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method | Masakatsu Suda | 2011-11-15 |
| 7987062 | Delay circuit, test apparatus, storage medium semiconductor chip, initializing circuit and initializing method | Kazuhiro Fujita, Masakatsu Suda | 2011-07-26 |