Issued Patents 2011
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8058891 | Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method | Takuya Hasumi | 2011-11-15 |
| 7987062 | Delay circuit, test apparatus, storage medium semiconductor chip, initializing circuit and initializing method | Kazuhiro Fujita, Takuya Hasumi | 2011-07-26 |
| 7979218 | Test apparatus, test method and computer readable medium | — | 2011-07-12 |
| 7960996 | Variable delay circuit, timing generator and semiconductor testing apparatus | — | 2011-06-14 |
| 7944263 | Timing generator and semiconductor test apparatus | — | 2011-05-17 |
| 7940072 | Timing generator and semiconductor test apparatus | — | 2011-05-10 |
| 7908110 | Test device, test method and computer readable media | — | 2011-03-15 |
| 7863990 | Oscillation circuit, test apparatus and electronic device | — | 2011-01-04 |