Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6963206 | System and method of evaluating gate oxide integrity for semiconductor microchips | — | 2005-11-08 |
| 6869873 | Copper silicide passivation for improved reliability | Robert W. Bradshaw, Daniele Gilkes, Sailesh Mansinh Merchant, Kurt G. Steiner | 2005-03-22 |