Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6932475 | Device for measuring aberration refraction of the eye | Ioannis Pallikaris, Igor Chyzh, Vyacheslav Sokurenko, Leonidas Naoumidis, Youssef Wakil | 2005-08-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6932475 | Device for measuring aberration refraction of the eye | Ioannis Pallikaris, Igor Chyzh, Vyacheslav Sokurenko, Leonidas Naoumidis, Youssef Wakil | 2005-08-23 |