Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6864971 | System and method for performing optical inspection utilizing diffracted light | A. Kathleen Hennessey, Yongqiang Liu, Yonghang Fu, Masami Yamashita, Ichiro Shimomura | 2005-03-08 |
| 6847443 | System and method for multi-wavelength, narrow-bandwidth detection of surface defects | David W. Herod | 2005-01-25 |