Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6870375 | System and method for measuring a capacitance associated with an integrated circuit | Xiaowei Deng, James D. Gallia | 2005-03-22 |
| 6856143 | System and method for measuring a capacitance of a conductor | Michael J. McNutt, Yu-Sang Lin | 2005-02-15 |