Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6967499 | Dual ramp rate dielectric breakdown testing methodology | Gaddi S. Haase | 2005-11-22 |
| 6965136 | Photon-blocking layer | Yaojian Leng, Honglin Guo | 2005-11-15 |
| 6919219 | Photon-blocking layer | Yaojian Leng, Honglin Guo | 2005-07-19 |