Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6967110 | Sensitive test structure for assessing pattern anomalies | Richard L. Guldi, Anand J. Reddy | 2005-11-22 |
| 6919605 | Integrated circuit MOS transistor with reduced drain and source resistance | — | 2005-07-19 |