Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6872627 | Selective formation of metal gate for dual gate oxide application | Minghsing Tsai | 2005-03-29 |
| 6865948 | Method of wafer edge damage inspection | — | 2005-03-15 |
SC
Sheng-Hsiung Chen
Overall (2005): #35,508 of 245,428Top 15%
2
Patents 2005