Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6930502 | Method using conductive atomic force microscopy to measure contact leakage current | Jung-Hsiang Chuang | 2005-08-16 |
JL
Jon Lee
Overall (2005): #170,662 of 245,428Top 70%
1
Patents 2005