Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6961670 | Probe testing method and apparatus for determining acceptable/defective end shape of contact probe through image analysis | Yoshihiro Sasaki | 2005-11-01 |
| 6899965 | Dielectric film and method for forming the same | Kenji Iijima | 2005-05-31 |