Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6972582 | Apparatus and method for measuring semiconductor wafer electrical properties | Robert Mazur | 2005-12-06 |
| 6937050 | Non-contact mobile charge measurement with leakage band-bending and dipole correction | Min-Su Fung, Roger L. Verkuil, Gregory S. Horner | 2005-08-30 |
| 6894519 | Apparatus and method for determining electrical properties of a semiconductor wafer | — | 2005-05-17 |
| 6842029 | Non-invasive electrical measurement of semiconductor wafers | — | 2005-01-11 |