Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6873173 | Test circuit arrangement and method for testing a multiplicity of transistors | Ute Kollmer, Carsten Linnenbank, Roland Thewes | 2005-03-29 |
US
Ulrich Schaper
Overall (2005): #81,770 of 245,428Top 35%
1
Patents 2005