Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6936299 | Method and device for in situ layer thickness determination | Ulrich Bast, Roman Beyer | 2005-08-30 |
| 6878041 | Method for removing a metallic layer of a layer-system | Winfried Esser | 2005-04-12 |