Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6953519 | Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus | Hiroshi Takahashi, Tadashi Arai | 2005-10-11 |
| 6941798 | Scanning probe microscope and operation method | Takehiro Yamaoka, Kazutoshi Watanabe, Kazunori Ando | 2005-09-13 |
| 6932504 | Heated self-detecting type cantilever for atomic force microscope | Hiroshi Takahashi, Tadashi Arai | 2005-08-23 |