Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6944548 | Formation evaluation through azimuthal measurements | Richard J. Radtke, Robert A. Adolph, Loic Vilde, Nihal Wijeyesekera | 2005-09-13 |
| 6903330 | Multi-point subsurface measurement calibration | Luca Ortenzi, Richard J. Radtke | 2005-06-07 |