Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6842030 | Test systems for low-temperature environmental testing of semiconductor devices | Ki-Yeul Kim | 2005-01-11 |
| 6838897 | Integrated circuit test system and method | Ki-Yeul Kim, Jae-Hoon Cha | 2005-01-04 |