Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6855590 | Method of manufacturing the semiconductor device intended to prevent a leakage current from occuring due to a gate induced drain leakage effect | Seung Hyun Park, Han-Sin Lee, Moo-Sung Kim, Won-Suk Yang | 2005-02-15 |