Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6888366 | Apparatus and method for testing a plurality of semiconductor chips | Ho Jin Park, Sung-Hwan In, Ha Il Kim | 2005-05-03 |
| 6845407 | Semiconductor memory device having externally controllable data input and output mode | Yong Jin Park, Sang Keun Park, Young Gu Kang | 2005-01-18 |