Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6870387 | Method and test structures for measuring interconnect coupling capacitance in an IC chip | Kai-Ye Huang | 2005-03-22 |
| 6858900 | ESD protection devices and methods to reduce trigger voltage | Wei-Fan Chen, Shi-Tron Lin | 2005-02-22 |