Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6968280 | Method for analyzing wafer test parameters | Ching-Ly Yueh | 2005-11-22 |
| 6959252 | Method for analyzing in-line QC test parameters | Haw-Jyue Luo | 2005-10-25 |
| 6950783 | Method and related system for semiconductor equipment prevention maintenance management | Chien-Chung Chen, Sheng-Jen Wang | 2005-09-27 |
| 6904384 | Complex multivariate analysis system and method | — | 2005-06-07 |
| 6898539 | Method for analyzing final test parameters | Chien-Chung Chen | 2005-05-24 |