Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6946864 | Method for measuring product parameters of components formed on a wafer and device for performing the method | Wolfgang Gramann, Werner Spath, Wolfgang Teich | 2005-09-20 |
| 6897488 | Radiation-emitting chip | Johannes Baur, Dominik Eisert, Michael Fehrer, Berthold Hahn, Volker Harle +5 more | 2005-05-24 |