Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6884637 | Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure | Hiroyuki Fukunaga, Hiroyuki Nakayashiki | 2005-04-26 |