ZN

Zvi Nirel

NI Nova Measuring Instruments: 1 patents #3 of 12Top 25%
📍 Mevaseret Tsiyon, IL: #8 of 19 inventorsTop 45%
Overall (2005): #66,968 of 245,428Top 30%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6842220 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Yoel Cohen 2005-01-11