YA

Yoav Alper

NI Nova Measuring Instruments: 1 patents #3 of 12Top 25%
Overall (2005): #72,145 of 245,428Top 30%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6964276 Wafer monitoring system Benjamin Shulman 2005-11-15