Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6853925 | Gas flow method for detection of local preform defects based on statistical analysis | Isaac M. Daniel, Sun Kyoung Kim | 2005-02-08 |
JO
Jeremy G. Opperer
Overall (2005): #176,560 of 245,428Top 75%
1
Patents 2005