EY

Eiji Yonezawa

NC Nidek Co.: 1 patents #2 of 30Top 7%
📍 Ebeye: #89 of 366 inventorsTop 25%
Overall (2005): #207,049 of 245,428Top 85%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6928185 Defect inspection method and defect inspection apparatus — 2005-08-09