YK

Yasuhiro Kawata

AD Advantest: 1 patents #20 of 85Top 25%
📍 Anan, JP: #14 of 44 inventorsTop 35%
Overall (2005): #73,648 of 245,428Top 35%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6877118 Memory testing method and memory testing apparatus Hiromi Oshima, Noboru Okino 2005-04-05