YN

Yuichi Naitou

NE Nec: 1 patents #191 of 878Top 25%
Overall (2005): #68,470 of 245,428Top 30%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6888135 Scanning probe microscope with probe formed by single conductive material Norio Ookubo 2005-05-03