MN

Masahiko Nagao

NE Nec Electronics: 2 patents #21 of 259Top 9%
Overall (2005): #43,970 of 245,428Top 20%
2
Patents 2005

Issued Patents 2005

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6954274 Method of inspecting semiconductor integrated circuit which can quickly measure a cubic body Yoshihiro Sasaki 2005-10-11
6950549 Visual inspection method and visual inspection apparatus Yoshihiro Sasaki 2005-09-27