Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6946678 | Test key for validating the position of a word line overlaying a trench capacitor in DRAMs | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang | 2005-09-20 |
| 6902942 | Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices | Chien-Chang Huang, Bo Ching Jiang, Yu-Wei Ting, Chin-Ling Huang | 2005-06-07 |
| 6891216 | Test structure of DRAM | Chien-Chang Huang, Chin-Ling Huang, Yu-Wei Ting, Bo Ching Jiang | 2005-05-10 |
| 6844207 | Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang, Chin-Ling Huang | 2005-01-18 |
| 6838296 | Device and method for detecting alignment of deep trench capacitors and active areas in DRAM devices | Chien-Chang Huang, Bo Ching Jiang, Yu-Wei Ting | 2005-01-04 |