Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6903976 | Semiconductor memory device reduced in power consumption during burn-in test | Takeshi Hamamoto | 2005-06-07 |
| 6895537 | Semiconductor integrated circuit device including semiconductor memory with tester circuit capable of analyzing redundancy repair | Jun Ohtani | 2005-05-17 |