Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6962827 | Semiconductor device capable of shortening test time and suppressing increase in chip area, and method of manufacturing semiconductor integrated circuit device | Katsuya Furue, Shigeru Kikuda, Tetsushi Tanizaki, Shigehiro Kuge, Takashi Kono | 2005-11-08 |