SS

Steven J. Simmons

Micron: 1 patents #434 of 861Top 55%
📍 Fraser, MI: #3 of 7 inventorsTop 45%
🗺 Michigan: #1,426 of 5,720 inventorsTop 25%
Overall (2005): #96,719 of 245,428Top 40%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6890775 Yield based, in-line defect sampling method — 2005-05-10