Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6944567 | Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufacture | — | 2005-09-13 |
| 6852999 | Reduced terminal testing system | Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud | 2005-02-08 |