Issued Patents 2005
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6979601 | Methods for fabricating fuses for use in semiconductor devices and semiconductor devices including such fuses | Michael P. Violette | 2005-12-27 |
| 6943575 | Method, circuit and system for determining burn-in reliability from wafer level burn-in | — | 2005-09-13 |
| 6936909 | Gate dielectric antifuse circuit to protect a high-voltage transistor | John D. Porter | 2005-08-30 |
| 6914306 | Electrostatic discharge protection device | — | 2005-07-05 |
| 6894526 | Apparatus for determining burn-in reliability from wafer level burn-in | — | 2005-05-17 |
| 6879018 | Fuse for use in a semiconductor device, and semiconductor devices including the fuse | Michael P. Violette | 2005-04-12 |
| 6867612 | Method for wafer-level burn-in stressing of semiconductor devices and semiconductor device substrates configured to effect the method | — | 2005-03-15 |