Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6903995 | Test structure for the measurement of contact to gate distance in non-volatile memory devices and corresponding test method | Emilio Camerlenghi, Paolo Cappelletti, Tecla Ghilardi, Mauro Sali | 2005-06-07 |