Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6972580 | Selectively configurable probe structures, e.g., for testing microelectronic components | Ralph Schaeffer | 2005-12-06 |
| 6952109 | Selectively configurable probe structures, e.g., for testing microelectronic components | Ralph Schaeffer | 2005-10-04 |
| 6924653 | Selectively configurable microelectronic probes | Ralph Schaeffer | 2005-08-02 |
| 6841991 | Planarity diagnostic system, E.G., for microelectronic component test systems | Michael Martin | 2005-01-11 |