CT

Constatine J. Tsikos

MI Metrologic Instruments: 1 patents #35 of 56Top 65%
📍 Voorhees, NJ: #1 of 9 inventorsTop 15%
🗺 New Jersey: #1,157 of 4,577 inventorsTop 30%
Overall (2005): #220,225 of 245,428Top 90%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6969001 METHOD OF SPECKLE-NOISE PATTERN REDUCTION AND APPARATUS THEREFOR BASED ON REDUCING THE SPATIAL-COHERENCE OF THE PLANAR LASER ILLUMINATION BEAM BEFORE IT ILLUMINATES THE TARGET OBJECT BY APPLYING SPATIAL INTENSITY MODULATION TECHNIQUES DURING THE TRANSMISSION OF THE PLIB TOWARDS THE TARGET C. Harry Knowles, Allan Wirth, Timothy Good, Andrew Jankevics 2005-11-29