Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6931579 | Integrated excitation/extraction system for test and measurement | Mohamed M. Hafed | 2005-08-16 |
| 6917320 | Method and device for use in DC parametric tests | Clarence K. L. Tam | 2005-07-12 |
| 6914548 | Programmable DC voltage generator | Mohamed M. Hafed, Sebastien Laberge | 2005-07-05 |
| 6850051 | Timing measurement device using a component-invariant vernier delay line | Antonio Chan | 2005-02-01 |