Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6934040 | Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers | Anh Hoang, Dmitry Bakin | 2005-08-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6934040 | Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers | Anh Hoang, Dmitry Bakin | 2005-08-23 |