Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6960764 | Method of measuring the performance of a scanning electron microscope | Rene Elfrink, Casparus Anthonius Henricus Juffermans | 2005-11-01 |
PD
Peter Dirksen
Overall (2005): #124,123 of 245,428Top 55%
1
Patents 2005